单词查询
ellipsometry
美[ɪlep'sɒmətrɪ]，英[elɪp'sɒmɪtrɪ]，
释义
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n. 椭圆偏振计测量；椭圆计测量；椭圆率测量术；椭圆对源； 网络释义： 椭圆偏振技术；椭圆光度法；椭圆偏光仪；
例句
Owing to its advantages, ellipsometry and automatic ellipsometers can be used in many other fields and will gain good results.
并且，自动椭偏仪在其他领域的测量应用前景也很好。
The electro-optic index of PLZT thin films was measured by means of modulated ellipsometry.
利用调制式的椭偏仪测量了掺镧锆钛酸铅PLZT薄膜的电光系数。
To attain high precise optical parameters of thin films, it's necessary to solve data processing in ellipsometry.
数据处理一直是椭偏测量术获取高精度薄膜结构参数的一个难点。
Imaging technique, interferometric method and ellipsometry are used in the defect detection of the thin film.
在薄膜缺陷检测领域，成像技术，干涉测量，椭偏测量等一系列测量手段都得到了应用。
SCI offers diverse tools for optical thin film design, material analysis, ellipsometry, and spectrophotometry.
为薄膜设计，材料分析，椭圆偏光法，分光光度测定法提供不同的工具。最近的光学薄膜软件包括：一。
Spectroscopic imaging ellipsometry (SIE) is used to characterize a nano film pattern on a solid substrate.
提出一种对固相基底上纳米薄膜图案进行表征的光谱椭偏成像系统。
Paints quality , Plastics , Polymer, Optical Brighteners and Phosphor Coatings ( Ellipsometry )
油漆质量，塑料，聚合物，荧光增白剂和磷涂层（椭圆偏振仪）
并且，自动椭偏仪在其他领域的测量应用前景也很好。
The electro-optic index of PLZT thin films was measured by means of modulated ellipsometry.
利用调制式的椭偏仪测量了掺镧锆钛酸铅PLZT薄膜的电光系数。
To attain high precise optical parameters of thin films, it's necessary to solve data processing in ellipsometry.
数据处理一直是椭偏测量术获取高精度薄膜结构参数的一个难点。
Imaging technique, interferometric method and ellipsometry are used in the defect detection of the thin film.
在薄膜缺陷检测领域，成像技术，干涉测量，椭偏测量等一系列测量手段都得到了应用。
SCI offers diverse tools for optical thin film design, material analysis, ellipsometry, and spectrophotometry.
为薄膜设计，材料分析，椭圆偏光法，分光光度测定法提供不同的工具。最近的光学薄膜软件包括：一。
Spectroscopic imaging ellipsometry (SIE) is used to characterize a nano film pattern on a solid substrate.
提出一种对固相基底上纳米薄膜图案进行表征的光谱椭偏成像系统。
Paints quality , Plastics , Polymer, Optical Brighteners and Phosphor Coatings ( Ellipsometry )
油漆质量，塑料，聚合物，荧光增白剂和磷涂层（椭圆偏振仪）